The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 27, 2001
Filed:
Jun. 14, 1999
Heimann Systems GmbH, Weisbaden, DE;
Abstract
A method for detecting X-rays which are separated into individual energy ranges after penetrating an object, as well as to an arrangement for implementing this method. It is known to detect X-rays (FX) by using detection devices (,), consisting of several identically configured detector pairs. The detector pairs in that case consist of a low-energy detector (,) and a high-energy detector (,). As a result, the weakened X-ray beam (FX′) is separated into individual energy ranges following the X-raying of an object (,). This separation is necessary to determine the types of material in the X-rayed object (,). The disadvantage of known detection devices (,) is that an overlapping of the individual energy ranges occurs in the low-energy detector (,), thereby making it impossible to detect the material type with certainty. This problem is avoided by providing for computing out the high-energy shares absorbed in the low-energy detector (,) with the aid of an additional signal. For this purpose, a second low-energy detector (,) is arranged between the first low-energy detector (,) and the high-energy detector (,). An energy spectrum (FX,) that is absorbed in the second low-energy detector (,) is used to obtain the signal to be subtracted.