The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 27, 2001
Filed:
Nov. 05, 1998
Angelina Thompson, San Jose, CA (US);
Terrance N. Clapham, Saratoga, CA (US);
George Caudle, San Jose, CA (US);
Visx, Incorporated, Santa Clara, CA (US);
Abstract
Improved systems, methods, and apparatus for calibrating a laser ablation system by measuring the optical power and shape of a test surface that has been ablated by energy delivered from a laser. The quality of the ablated test surface can be monitored to minimize undesirable laser system performance, such as might result from flawed internal optics, misalignment, poor laser fluence and the like. Calibration accuracy is generally enhanced by analyzing distortions of a geometrical pattern superimposed with the ablation test surface. The interaction of the pattern and the lens can be analyzed using a microscope, video camera connector, and other existing components of the laser ablation system, and can also provide quantitative test surface characteristics which may be used to accurately adjust the laser system.