The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 27, 2001

Filed:

Jan. 08, 1998
Applicant:
Inventors:

Andreas E. Dianna, Walnut Port, PA (US);

James G. Costello, Huntington, NY (US);

Assignee:

Olympus America, Inc., Melville, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 ;
U.S. Cl.
CPC ...
H04N 7/18 ;
Abstract

A system for determining a dimension of a detail including an optical scope for producing an image of the detail, an image scaling device for providing a scaled image size, and a processor. The system also includes a video camera which is either within the optical scope or external to the optical scope. The optical scope includes a focusing device for adjusting a focal position of the image of the detail and a device for providing a focus position signal based a position of the focusing device. If the system includes an external video camera, the optical scope also includes a viewer for passing the image of the detail to a plane outside of the optical scope. The video camera optically is coupled with the viewer of the optical scope or with the image of the detail and produces a video signal of the detail from the image of the detail. The processor converts the focus position signal into an object distance signal, or a magnification signal, or both, and determines the dimension of the detail based on the scaled image size and based on the object distance signal, or the magnification signal, or both.


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