The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 27, 2001
Filed:
Nov. 23, 1999
Tony G. Ivanov, Orlando, FL (US);
Michael Scott Carroll, Orlando, FL (US);
Lucent Technologies Inc., Murray Hill, NJ (US);
Abstract
A wafer configured for in-process testing of electrical components has a plurality of dies disposed on the wafer, wherein adjacent dies are separated from one another by streets. An in-line device monitor having a first port, a second port, and a device-under-test substantially in line with one another is placed within a street, where the device-under-test is between the first and second ports and is electrically coupled to the first and second ports. With such an arrangement, streets having a width of 100 microns and less are suitable for accomodating a RF-device monitor having ground-signal or ground-signal-ground configurations. As a result, accurate GS or GSG RF-device monitors can be provided in narrow streets of wafers, thereby increasing the amount of wafer area available for circuitry.