The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 27, 2001

Filed:

Oct. 01, 1998
Applicant:
Inventor:

Vladimir Bosnjakovic, Belgrade, YU;

Assignee:

ADAC Laboratories, Milpitas, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/20 ; G01T 7/00 ;
U.S. Cl.
CPC ...
G01T 1/20 ; G01T 7/00 ;
Abstract

A universal nuclear medicine imager (UNMI) enables planar, SPECT and PET studies. The UNMI is a “position sensitive” type of detector which has a relatively thick (e.g., {fraction (6/8)} in.) NaI(TI) crystal optically divided by a thin non-scintillating material into two half-thicknesses of ⅜ in. each. The UNMI detector uses a light collimator system to enable a depth of interaction (DOI) determination in addition to a two-dimensional location of gamma photons in the half-thicknesses of the crystal. The system includes a combination of a scintillating, optically more dense material with a non-scintillating, optically less dense material and uses the light refraction reflection law with PM tubes and coincidence circuits. For obtaining the optimal spatial resolution in planar and SPECT studies, a known DOI enables the use of only the lower ⅜ in. of the crystal (energies up to 150 KeV) or both of the half-thicknesses for medium energies (250, 360 KeV), with the resolution in each being corrected by use of digital filters. In PET detection of 511 KeV energies, a known DOI improves the resolution by correcting for parallax error in addition to the use of an adequately thick crystal.


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