The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 27, 2001
Filed:
Nov. 03, 1997
Applicant:
Inventors:
Leslie Rehg, San Diego, CA (US);
Ching Huang, Chula Vista, CA (US);
Michael J. Willrodt, Escondido, CA (US);
Herbert Bradfield Cunningham, Julian, CA (US);
Eugene Fan, La Jolla, CA (US);
Assignee:
Wyntek Diagnostics, Inc., San Diego, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/3533 ;
U.S. Cl.
CPC ...
G01N 3/3533 ;
Abstract
This invention relates to a lateral flow immunochromatographic assay device with an increased range of sensitivity without an increase in the clearance time or the occurrence of false positive results. The indicator reagent for the analyte is located in both a separate labeling reagent region and a discrete zone of the analyte detection region.