The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 27, 2001
Filed:
Sep. 18, 1998
Dan Slater, La Habra Heights, CA (US);
Thomas Paige, Cypress, CA (US);
Nearfield Systems Incorporated, Carson, CA (US);
Abstract
A two-axis measurement system for use with an article under test (AUT) is provided with a thermal control system to maintain the measurement system at a stable temperature. The thermal control system may be use a temperature-controlled fluid, such as liquid or gas, conducted through the measurement system. The measurement system further comprises a field probing sensor that is adapted to be positioned at a plurality of points spaced from the AUT to perform a measurement of the AUT. The probing sensor is manipulated by at least a first member extending in a first axial direction and a second member extending in a second axial direction perpendicular to the first axial direction. A near-field measurement of the AUT is performed by moving the field probing sensor in a pattern in front of the AUT to sample the RF energy of the AUT at a plurality of points. Internal passageways provided through the first and second members permit communication of the temperature-controlled fluid therethrough.