The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 20, 2001

Filed:

Sep. 16, 1998
Applicant:
Inventors:

Gary Martin Johnston, Durham, NC (US);

Mila Keren, Nesher, IL;

Anthony Hayden Lindsey, Fuquay Varina, NC (US);

Yael Shaham-Gafni, Haifa, IL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/45 ;
U.S. Cl.
CPC ...
G06F 9/45 ;
Abstract

A method, system, and computer program for providing test coverage metrics in a visual programming environment. A test coverage model for visual programming is defined, which accounts for the specialized nature of visual programming, and the metrics are based on this model. The metrics are expressed in terms of elements familiar to the visual programmer, as opposed to using source code metrics. In a preferred embodiment, these elements comprise events, actions, connections, and attributes. The code implementing a visual program is instrumented according to this model, and test coverage information is gathered as the instrumented program executes.


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