The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2001
Filed:
Mar. 13, 1998
Applicant:
Inventors:
Ingwer Carlsen, Kiel, DE;
Johannes J. Van Vaals, Eindhoven, NL;
Volker Rasche, Hamburg, DE;
Michael Grass, Ellerbek, DE;
Assignee:
U.S. Philips Corporation, New York, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/05 ;
U.S. Cl.
CPC ...
A61B 5/05 ;
Abstract
The invention relates to an image processing method for improving the signal-to-noise ratio for a series of MR images or CT images which are based on the projection-reconstruction method. First the pixels which reproduce the same sub-structure in the projection images are determined in the one-dimensional projection images constituting the two-dimensional MR or CT images. The image values of these pixels are subjected to noise filtering. Two-dimensional MR images or CT images are reconstructed from the noise filtered one-dimensional projection images.