The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 20, 2001

Filed:

Jan. 24, 2000
Applicant:
Inventor:

Sumio Ogawa, Hiroshima, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 7/00 ;
U.S. Cl.
CPC ...
G11C 7/00 ;
Abstract

A semiconductor memory test circuit comprises a current mirror circuit including a reference side current path composed of a series connection of alternating p channel transistors and n channel transistors and an output side current path composed of a series connection of alternating p channel transistors and n channel transistors, an output signal for electrode of paired memory cells and a balance potential output signal for sense amplifier, required for a semiconductor memory test, being derived from the output side current path. The current mirror circuit includes a first output side current path and a second output side current path, the balance output for sense amplifier is derived from an output of the first output side current path and the output signal for electrode of paired memory cells is derived from an output of the second output side current path.


Find Patent Forward Citations

Ogawa, Sumio. (2001). Semiconductor memory test circuit (U.S. Patent No. 6191987). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6191987

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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