The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 20, 2001

Filed:

Sep. 28, 1999
Applicant:
Inventors:

Tetsuji Yamaguchi, Kyoto, JP;

Tatsuo Igushi, Kyoto, JP;

Assignee:

Horiba, Ltd., Kyoto, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 1/502 ;
U.S. Cl.
CPC ...
G01N 1/502 ;
Abstract

An apparatus and method for measuring a particle size distribution comprising a light source directing a laser light to particles which are dispersed into a solvent and which exhibit Brownian motion, a detector converting an interference light caused by Doppler-shifted scattered light by the particles into an electric detection signal, an operation unit obtaining an intermediate function by processing the detection signal, and a processing unit subjecting the intermediate function to an inverse problem and thereby calculating a particle size distribution. The apparatus includes a data selecting unit between the operation unit and the processing unit for selecting data from all data regions in the intermediate function at appropriate intervals and creating a data table used in an inverse problem.


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