The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2001
Filed:
Oct. 13, 1998
Wolfgang Paffhausen, Leverkusen, DE;
Martin Bechem, Wuppertal, DE;
Bayer Aktiengesellschaft, Leverkusen, DE;
Abstract
In the measurement system for detecting optical signals of microassays, the signal-generating test objects,are arranged on an investigation surface of a planar carrier,The planar carrier,is, in particular, a microtitre plate for biological objects. In principle, the measurement system comprises an optical imaging arrangement which reduces the size of the test objects,to be measured in such a way that all the objects are imaged completely on a two-dimensional, photosensitive image sensor,For imaging, a high-resolution glass-fiber taper element,having a large-area,and a small-area end,is used in this case, whose end surfaces,are selected such that the large-area end surface,corresponds at least to the investigation surface of the carrier,and the small-area end surface,corresponds to the size of the image sensor,the ratio of the end surfaces,producing the scale of reduction of the optical imaging arrangement in order to image the investigation surface of the carrier,completely onto the image sensor