The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2001
Filed:
Apr. 30, 1998
Koji Tsuzukiyama, Sodegaura, JP;
Masanori Motooka, Ichihara, JP;
Toshiyuki Fujiwara, Ibaragi-ken, JP;
Michio Toriumi, Ichihara, JP;
Other;
Abstract
A drawing system in which a thickness and degree of orientation of an oriented film or the like is maintained in a uniform manner under a condition of a high speed, shortened is a time required from a time when a molding material is charged in an extruder and drawing started until a time when a film is taken up on a take-up apparatus, and a high quality film or the like is produced at a high speed and besides, a probability for a not-oriented or oriented film or the like to be broken down during drawing is reduced. A thickness and degree of orientation of a film are independently measured in thickness gauges and a film orientation measuring apparatus in a continuous manner after longitudinal drawing or lateral drawing and measured values are input to a computer. The computer input with the measured values respectively compares preset target values with the measured thickness and degree of orientation and a control operation to change a longitudinal draw ratio is conducted if the measured values are different from respective preset values based on results of comparison processing.