The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2001
Filed:
Dec. 05, 1997
Fang Chen, Rochester Hills, MI (US);
Anthony M. Waas, Saline, MI (US);
Everett You-Ming Kuo, Troy, MI (US);
Howard Kiel Plummer, Jr., Dearborn, MI (US);
Thomas Eugene Allen, Royal Oak, MI (US);
Ford Global Technologies, Inc., Dearborn, MI (US);
Abstract
A method of using a microscopic digital imaging strain gauge includes the steps of creating a mark pattern on an object surface, positioning an image sensing device over the mark pattern, magnifying the mark pattern with a magnification lens, taking a first magnified image of the mark pattern with the image sensing device, applying a load to the object surface, taking a second magnified image of the mark pattern, and utilizing a processor to calculate the strain as derived from the first and second magnified images.