The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 13, 2001
Filed:
Jan. 22, 1999
Christoph Schiller, Eindhoven, NL;
Mark A. De Samber, Eindhoven, NL;
Lambertus G. J. Fokkink, Eindhoven, NL;
U.S. Philips Corporation, New York, NY (US);
Abstract
An X-ray examination apparatus (,), including an X-ray source (,) and an X-ray detector (,), is provided with an X-ray filter (,) which is arranged between the X-ray source and the X-ray detector. The X-ray filter (,) includes a plurality of filter elements (,) whose X-ray absorptivity can be adjusted by adjustment of a quantity of X-ray absorbing liquid (,) within the individual filter elements; a first end of individual filter elements communicates with the X-ray absorbing liquid whereas a second end communicates with an X-ray transparent liquid (,). The X-ray filter is preferably provided with a pressure control system for independent control of the liquid pressure in individual row ducts (,) and individual column ducts (,). Individual filter elements are preferably provided with a piston for separating the X-ray absorbing liquid from the X-ray transparent liquid.