The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 13, 2001
Filed:
May. 03, 1999
George H. Miley, Champaign, IL (US);
Yibin Gu, Champaign, IL (US);
The Board of Trustees of University of Illinois, Urbana, IL (US);
Abstract
A low cost small-scale tunable X-ray source, comprising a spherical-electron injected inertial electrostatic confinement (IEC) device. Within a spherical containment vessel (,) recirculatory focusing electrons are accelerated by a spherical grid (,) within the vessel, and cause electron—electron collisions in a dense, central plasma core region (,) of the sphere. The IEC synchrotron source (IEC-SS) in a mechanism for generating tunable X-ray radiation is essentially equivalent to that for conventional synchrotron sources. The IEC-SS operates at a much lower electron energy (<100 kev compared with >200 Mev in a synchrotron), but still gives the same X-ray energy due to the small-scale bending radius associated with the electron—electron interactions. The X-rays can be filtered for particular purposes using diffraction gratings, prisms or the like.