The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 13, 2001

Filed:

Aug. 20, 1999
Applicant:
Inventor:

Toshiaki Nihoshi, Yokohama, JP;

Assignee:

Nikon Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 2/100 ; G02B 2/120 ;
U.S. Cl.
CPC ...
G02B 2/100 ; G02B 2/120 ;
Abstract

A lens system for a microscope having a variable angle lens-barrel. The lens-barrel includes an afocal optical system lying along an optical path extending from an infinite correction type objective lens to an ocular lens and comprises a first lens group which has positive refractive power, a second lens group which has negative refractive power, and a third lens group which has positive refractive power. The lens system includes a reflective mirror positioned between the second lens group and the third lens group which is mounted for rotation a out a pendular axis. Light through the infinite correction type objective lens becomes a parallel light beam which is passed to the third lens group from the reflective mirror.


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