The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 13, 2001
Filed:
Jul. 29, 1999
Gary L. Cloud, East Lansing, MI (US);
Board of Trustees operating Michigan State University, East Lansing, MI (US);
Abstract
Presented is a speckle interferometer for measuring displacement of an optically irregular surface of a specimen having, a laser for producing a beam of coherent radiation, an adjustable polarizing beam splitter for dividing the radiation into a first portion of the radiation and into a second portion of the radiation. The reflected radiation is then passed through a pair of collimating lenses onto the optically rough surface of the specimen. The reflection off of the specimen is captured by an imaging system that processes the reflection to measure strains on the surface.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile