The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 13, 2001

Filed:

Sep. 29, 1998
Applicant:
Inventors:

Hideki Matsuoka, Gifu, JP;

Takao Suzuki, Hashima-gun, JP;

Norio Oku, Motosu-gun, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/1333 ; G02F 1/13 ;
U.S. Cl.
CPC ...
G02F 1/1333 ; G02F 1/13 ;
Abstract

In a LCD with a built-in driver, the quality of all elements is judged. A test TFT is formed immediately below a sealing material which bonds a TFT substrate and an opposite substrate, wherein test terminals are pulled out onto the eaves section of the TFT substrate protruding from the opposite substrate. The quality of TFTs are judged by considering changes of TFT characteristics under the conditions before and after the bonding process.


Find Patent Forward Citations

Matsuoka, Hideki. (2001). Display apparatus having test elements under or bounded by the sealant (U.S. Patent No. 6188453). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6188453

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…