The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 13, 2001

Filed:

Mar. 04, 1998
Applicant:
Inventor:

Gary Allen Martek, Edgewood, WA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01Q 2/100 ;
U.S. Cl.
CPC ...
H01Q 2/100 ;
Abstract

Systems and methods are disclosed for providing elevation scanning for a multiple beam antenna system on a per antenna beam basis. In a preferred embodiment columns of antenna elements are divided into sub-groups each having a beam forming matrix associated therewith. Phase differentials are introduced into the antenna beam signals of each sub-group of antenna elements in order to provide a phase progression which steers the antenna beam a predetermined angle from the broadside. The phase differentials are independently provided for each antenna beam signal to thereby allow independent steering of each antenna beam. Additionally, dielectric material placed in the signal feed path may be utilized to alter radiation characteristics of certain antenna elements of the antenna system. Placing the dielectric material with outer elements of an array may be used for aperture tapering and side lobe control. Additionally, wind loading, due to the antenna system is reduced by using a gridded ground plane system.


Find Patent Forward Citations

Loading…