The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 13, 2001
Filed:
Nov. 16, 1998
James J. Yuzwalk, Oxford, MI (US);
Walter R. Stringer, Oak Park, MI (US);
Chrysler Corporation, Auburn Hills, MI (US);
Abstract
A test system having a bifilar wound isolation network disposed in between a device under test (DUT) and a device under test support system for providing a high isolation impedance to common mode signals present at the input terminals of the isolation network, while still providing a relatively lossless path for differential signals present across the input terminals of the isolation network. The isolation network comprises a plurality of four resonators each having a precise, predetermined number of turns and serially interconnected by a bifilar winding. The bifilar winding allows coupling to the inputs of a balanced DUT and enables a worst case operating environment to be provided for the balanced DUT to assist in testing and/or design of the DUT so as to minimize the effects on the DUT of electromagnetic interference and to assist in modifying the balanced DUT so as to immunize it from susceptible EMI receptors therewithin.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile