The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 13, 2001
Filed:
Jan. 12, 1999
John W. Juvinall, Ottawa Lake, MI (US);
James A. Ringlien, Maumee, OH (US);
Owens-Brockway Glass Container Inc., Toledo, OH (US);
Abstract
A method and apparatus of measuring wall thickness of hollow glass articles, such as molded glass containers having interior and exterior wall surfaces, includes the steps of measuring intensity of radiation emitted by the article at a first wavelength at which intensity varies as a function of both temperature at the surfaces and wall thickness between the surfaces, and at a second wavelength at which intensity varies as a function of temperature at the surface substantially independent of wall thickness between the surfaces. Since the first intensity measurement is a function of both wall thickness and temperature, while the second intensity measurement is a function solely of surface temperature, wall thickness between the surfaces can determined as a combined function of the first and second intensity measurements.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile