The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 13, 2001

Filed:

May. 08, 1998
Applicant:
Inventors:

P. Scott Eastman, Moraga, CA (US);

Michael S. Urdea, Alamo, CA (US);

Janice A. Kolberg, Hercules, CA (US);

Assignee:

Bayer Corporation, East Walpole, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C12Q 1/68 ; C12P 1/934 ; C12N 7/00 ; C07H 2/102 ; C07H 2/104 ;
U.S. Cl.
CPC ...
C12Q 1/68 ; C12P 1/934 ; C12N 7/00 ; C07H 2/102 ; C07H 2/104 ;
Abstract

This invention relates to a method of measuring the relative populations of first and second variants of a target nucleotide sequence of a target genome in a sample utilizing an amplification step, followed by probing with first and second variant probes and a control probe. Specific embodiments include an assay to monitor the conversion of codon 215 for HIV-1 reverse transcriptase from wild type to mutant form.


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