The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 13, 2001
Filed:
Oct. 01, 1998
Applicant:
Inventors:
Chia-Ling Chien, Baltimore, MD (US);
Peter C. Searson, Baltimore, MD (US);
Kai Liu, Baltimore, MD (US);
Assignee:
The John Hopkins University, Baltimore, MD (US);
Primary Examiner:
Int. Cl.
CPC ...
C25D 5/02 ; G11B 5/66 ;
U.S. Cl.
CPC ...
C25D 5/02 ; G11B 5/66 ;
Abstract
Novel arrays of nanowires made of semi-metallic Bismuth (Bi) is disclosed made by unique electrodeposition techniques. Because of the unusual electronic properties of the semi-metallic Bi and the nanowire geometry, strong finite size effects in transport properties are achieved. In addition, very large positive magnetoresistance, 300% at low temperatures and 70% at room temperature, with quasilinear field dependence have been attained.
Chien, Chia-Ling. (2001). Arrays of semi-metallic bismuth nanowires and fabrication techniques therefor (U.S. Patent No. 6187165). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6187165
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile