The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 06, 2001

Filed:

Feb. 25, 1998
Applicant:
Inventors:

Anil K. Jain, Okemos, MI (US);

Lin Hong, Lansing, MI (US);

Rudolf Maarten Bolle, Bedford Hills, NY (US);

Sharathchandra Umapathirao Pankanti, Mt. Kisco, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 ;
U.S. Cl.
CPC ...
G06K 9/00 ;
Abstract

The invention is a system and method for matching a two dimensional pattern of lines, e.g. a fingerprint, by creating a one dimensional representation of one or more points (e.g., minutiae) on the lines in the patterns to be matched. The one dimensional representations are created by finding a corresponding reference point (minutiae) in each of the patterns and creating an index of other points in each of the respective patterns with respect to the reference point (minutiae). The indexes are adaptively compared taking into account the elastic distortions of the lines.


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Jain, Anil. (2001). System and method for matching (fingerprint) images an aligned string-based representation (U.S. Patent No. 6185318). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6185318

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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