The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 06, 2001

Filed:

Jul. 31, 1998
Applicant:
Inventors:

Jay N. Livingston, Lafayette, CO (US);

William G. Bliss, Thornton, CO (US);

Assignee:

Cirrus Logic, Inc., Austin, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 7/00 ;
U.S. Cl.
CPC ...
G11B 7/00 ;
Abstract

A sampled amplitude read channel is disclosed for disk storage systems comprising a encoder/decoder for implementing a high rate channel code that codes out specific minimum distance error events of a trellis sequence detector by enforcing a particular code constraint. The trellis sequence detector comprises a state machine matched to the code constraint which effectively removes the corresponding minimum distance errors from the detected output sequence. Additionally, the channel code encodes redundancy bits into the write data for implementing an error detection code. The redundancy bits are processed during a read operation to generate an error syndrome used to detect and correct other dominant error events, such as the NRZ (+) and (+−+) error events. In this manner, the most likely error events of the trellis sequence detector are either coded out by the channel code constraint, or detected and corrected using the error syndrome. As a result, the present invention provides a significant distance enhancing performance gain over the prior art without decreasing the system's code rate, thereby providing a substantial increase in linear bit density and overall storage capacity.


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