The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 06, 2001

Filed:

Mar. 10, 1998
Applicant:
Inventors:

Dabide Yamaguchi, Kanagawa, JP;

Tokio Ohto, Kanagawa, JP;

Kenji Harada, Tokyo, JP;

Akinori Sasaki, Tokyo, JP;

Assignee:

Fuji Electric Co., Ltd., Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/502 ;
U.S. Cl.
CPC ...
G01N 1/502 ;
Abstract

A method of measuring turbidity includes irradiating specimen water with a light beam, using photoelectric conversion means for subjecting to photoelectric conversion the light scattered by fine particles in the specimen water, inputting a pulse signal as an input signal,obtainable from the photoelectric conversion whenever the fine particle passes through the light beam so as to measure its peak value in a peak holding circuit,obtaining the number concentration of fine particles in the specimen water on the basis of particle diameter divisions according to the measured value, and multiplying the number concentration by an individual coefficient on the basis of the particle diameter divisions in order to obtain the turbidity of the specimen water.


Find Patent Forward Citations

Yamaguchi, Dabide. (2001). Method and apparatus for measuring turbidity (U.S. Patent No. 6184983). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6184983

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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