The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 06, 2001
Filed:
Mar. 30, 1999
Applicant:
Inventor:
Futoshi Ishida, Takatsuki, JP;
Assignee:
Minolta Co., Ltd., Osaka, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/188 ;
U.S. Cl.
CPC ...
G01N 2/188 ;
Abstract
An method and device for inspecting for surface defects, internal defects, and surface-adhered foreign matter on semitransparent materials. An illuminating device transmits light, that is then collimated through a collimating lens unit, through an object to be inspected. The light then transmits through the object to be inspected an eventually is detected by a detector. Any defects in the object to be inspected will be detected.