The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 06, 2001

Filed:

Apr. 20, 1999
Applicant:
Inventors:

George M. Walley, San Jose, CA (US);

Daniel L. Boritzki, Palm Bay, FL (US);

William D. Killen, Satellite Beach, FL (US);

Michael P. Zeitfuss, Satellite Beach, FL (US);

Assignee:

Harris Corporation, Melbourne, FL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01Q 3/00 ;
U.S. Cl.
CPC ...
H01Q 3/00 ;
Abstract

An antenna test range uses a direct spread-spectrum based test signal to effectively electronically reject all unwanted signals that may be present in the test range, and thereby allow both main beam and off-axis performance of the antenna to be completely and accurately measured. For increased dynamic range, the test signal comprises a carrier signal that is sequentially modulated with low rate, respectively different, direct spreading PN sequences applied to a cascaded plurality of N mixer stages through successive ones of which the carrier signal is coupled. The plurality of PN spreading sequences are mutually offset in time by a fraction of a chip, and thereby produce, at an output of an Nth mixer stage, a direct sequence spread spectrum carrier signal having its energy spread out over a bandwidth that is N times the spreading bandwidth of an individual one of the PN spreading sequences.


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