The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 06, 2001
Filed:
Aug. 17, 1998
Patrick L. Anderson, Redmond, WA (US);
Christer E. Bjorkegren, Woodinville, WA (US);
Lori E. Kovarik (Forner), Seattle, WA (US);
Bruce S. Howard, Bellevue, WA (US);
The Boeing Company, Seattle, WA (US);
Abstract
A measuring instrument and method for measuring paint and coating thickness on conductive and poorly conductive substrates. The instrument uses a microwave amplifier, a measurement cavity, and a reference cavity with supporting electronics to measure the apparent changes in the length of the measurement cavity due to the changes in the paint and coating thickness. The measurement cavity resonates when the measurement cavity is set upon the test surface. The oscillating signal is sent through a reference cavity tuned to give the desired filtered response to cover the paint and coating thickness range allowed. The filtered response of the reference cavity is converted to a dc level signal that serves as input to a data acquisition circuit. The data acquisition circuit converts the input signal to digital form so that the calibration method may be used to associate a given response with the corresponding paint and coating thickness.