The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 06, 2001
Filed:
Jan. 28, 1998
Casey L. Contini, Clermont, FL (US);
Lockheed Martin Corporation, Bethesda, MD (US);
Abstract
Methods and apparatus for generating uniform reference sources for use in calibrating multiple-detector imaging devices. In exemplary embodiments, a plano-plano reference lens is inserted at a non-focusing position in the optics path of a multiple-detector imaging device. The reference lens includes a highly polished side coated with a semi-reflective film and a rough polished side coated with an anti-reflective coating. The smooth polished side causes the detector array to see a reflected image of itself and a portion of the incoming scene energy simultaneously. The energy emitted by the detector array thus mixes with the scene energy to create a detected photon flux level which is dependent upon, but deviates in a controlled manner from, that of the scene energy alone. At the same time, the rough polished side and the thickness of the reference lens blur the detected image to eliminate scene structure and to provide a uniform photon flux level at each detector in the array. Since the detected flux is uniform and dependent upon the scene energy, the inserted reference lens effectively provides a reference source suitable for detector calibration. Additional reference lenses of varying reflectivity can be successively inserted to provide additional calibration points. Advantageously, the reference source levels vary automatically and passively with the viewed scene flux, and the present invention eliminates many of the drawbacks associated with conventional calibration techniques.