The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 06, 2001

Filed:

Nov. 12, 1997
Applicant:
Inventors:

Farrokh Omid-Zohoor, Sunnyvale, CA (US);

Yowjuang W. Liu, San Jose, CA (US);

Assignee:

Advanced Micro Devices, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 2/1762 ;
U.S. Cl.
CPC ...
H01L 2/1762 ;
Abstract

A trench isolation structure in a semiconductor substrate includes a trench opening in the surface of the substrate and a seamless oxide layer filling the trench. The seamless oxide layer is formed by forming a first oxide layer in the trench, adding a silicon material overlying the first oxide layer and within a gap on the first oxide layer between the trench sidewalls that tend to be produced in the preceding step, and oxidizing the silicon material to form a second oxide layer. The deposited silicon material expands during oxidation, filling the trench opening to produce a seamless oxide fill of the trench. This seamless trench isolation structure prevents accumulation of materials that reduce the yield of the finished semiconductor product.


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