The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2001
Filed:
Feb. 25, 1998
Atsushi Marugame, Tokyo, JP;
NEC Corporation, Tokyo, JP;
Abstract
A main image pickup section for picking up a main image and two or more subsidiary image pickup sections for picking up subsidiary images are used to shoot a subject. A 3-D object on which a predetermined pattern is drawn is also shot by the same image pickup sections, and parameters representing relative positions and attitudes of the image pickup sections are obtained using the images of the 3-D object. Feature points are extracted from each of the main image and the subsidiary images, and 3-D coordinates corresponding to each feature point in the main image are determined using the parameters and the feature points in the subsidiary images. Subsequently, judgment is executed and each of the feature points in the main image is accepted if the 3-D coordinates is within a designated 3-D space domain. Subsequently, subject outline points are extracted from the accepted feature points. Then, part of the main image which is surrounded by the subject outline points is extracted as the subject image. According to the device, subject image extraction can be extracted with high accuracy, without information of the subject or the image pickup device, without control or measurement of the positions of the image pickup devices, and with easy setting of a threshold value.