The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2001
Filed:
Sep. 29, 1997
Zhigang Fan, Webster, NY (US);
John W. Wu, Rancho Palos Verdes, CA (US);
Felice A. Micco, Grand Island, NY (US);
Mike C. Chen, Cerritos, CA (US);
Kien A. Phong, Anaheim, CA (US);
Xerox Corporation, Stamford, CT (US);
Abstract
An anti-counterfeit currency detection method is disclosed wherein local edge information is utilized for accurately detecting lines and curves of legitimate notes. The method can more accurately determine the location and orientation of a pattern and thus provides more reliable currency detection. A detector is trained off-line with example notes resulting in a stored template generated by recording a test pattern similar to a pattern to be tested; anchor lines are identified within said template which are further represented in subsequent test patterns. The template is rotated and shifted before matching it to the test pattern so that anchor lines align with long lines detected within the test pattern. The template and test pattern are then compared to determine whether there is a match. The system comprises a microprocessor is programmed to facilitate the training of a detector off-line with example notes which are scanned into said system wherein a template is generated by recording an image pattern of said example notes similar to a test pattern to be detected. The microprocessor identifies anchor lines within the template which are further represented in said test pattern; rotates and shifts the template before matching it to the test pattern so that anchor lines align with lines which may be detected within said test pattern; and compares the template to the test pattern to determine whether said anchor lines exist within said test pattern.