The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2001
Filed:
Jan. 13, 1998
Chih-Chau L. Kuan, Redmond, WA (US);
Shih-Jong J. Lee, Bellevue, WA (US);
Seho Oh, Mukilteo, WA (US);
Larry A. Nelson, Bellevue, WA (US);
Dayle G. Ellison, Redmond, WA (US);
Florence W. Patten, Issaquah, WA (US);
Neopath, Inc., Redmond, WA (US);
Abstract
A method and apparatus for optimizing biological and cytological specimen screening and diagnosis. A slide review process is recommended for cytological specimen screening to identify abnormal sub-populations for further review and also diagnosis by a human expert. An automated screener processes a cytological specimen. Using a slide score generated by the automated screener, a slide review process using a slide score classification is determined. The recommendation of slide review processes improves overall performance of the screening process as measured by sensitivity to abnormal specimens, and at the same time reduces the work load of a human reviewer. The system also effectively and smoothly integrates the process of initial screening of the specimen with the process of further review of the specimen and final diagnosis of the specimen.