The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2001
Filed:
Apr. 07, 1998
Robert Allen Hutchins, Tucson, AZ (US);
Scott Jeffrey Schaffer, Tucson, AZ (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method and apparatus for testing digital read channel circuits within a data storage device includes a digital read channel circuit coupled to a simulated impulse response module are disclosed. The data storage device includes a digital read channel circuit coupled to a simulated impulse response module. A pseudo analog-to-digital waveform is generated by the simulated impulse response module is input into the digital read channel circuit. The digital read channel circuit then decodes the pseudo analog-to-digital waveform to form a set of binary data. After receiving the set of binary data, a formatter/deformatter verifies the correctness of the binary data, such that the integrity of the digital read channel circuit and the formatter/deformatter can be determined.