The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2001
Filed:
Mar. 15, 1999
Applicant:
Inventors:
William V. Meyer, Lakewood, OH (US);
Anthony E. Smart, Costa Mesa, CA (US);
Assignee:
Ohio Aerospace Institute, Brook Park, OH (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 ;
U.S. Cl.
CPC ...
G01B 9/02 ;
Abstract
An interferometer having a light beam source that produces a plurality of separate and distinct wavelengths of light. Optic fibers are used to transport the wavelengths of light toward an object surface and to allow light reflected from the object to pass through a polarizer to improve the polarization ratio of the reflected light to determine a characteristic of the object surface.
Meyer, William. (2001). Optical device for measuring a surface characteristic of an object by multi-color interferometry (U.S. Patent No. 6181430). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6181430
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile