The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 30, 2001

Filed:

Dec. 22, 1998
Applicant:
Inventors:

Angelo Barberis, Milan, IT;

Stefano Caselli, Modena, IT;

Silvia Maria Pietralunga, Milan, IT;

Mario Martinelli, Milan, IT;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 ;
U.S. Cl.
CPC ...
G01B 9/02 ;
Abstract

There is provided a method and apparatus for measuring the optical properties of bulk samples. A probe laser beam is fed into the two arms of the apparatus, a reference arm and a measurement arm, both of which contain optical fiber to conduct the laser lights. The measurement arm includes a free space area for mounting a sample to be tested. The probe beam is directed into the sample in free space. The sample also receives light in free space, rather than via the optical fiber, from a second, pump laser. The interaction of the sample and the pump laser affect the optical properties of the sample. This change in optical properties can be detected by comparing the output signals from the measurement and reference arms.


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