The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2001
Filed:
Apr. 14, 1999
Applicant:
Inventor:
Robert Aaron Falk, Renton, WA (US);
Assignee:
OptoMetrix, Inc., Renton, WA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/141 ;
U.S. Cl.
CPC ...
G01N 2/141 ;
Abstract
An optical beam (,) passes through an illuminator (,), a semiconductor device (,), and an imager (,) to form a test object image (,) on a camera (,). Intensity variations in the object image (,) correspond to carrier density and temperature gradients inside the semiconductor device (,).
Falk, Robert. (2001). Schlieren method for imaging semiconductor device properties (U.S. Patent No. 6181416). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6181416
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile