The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 30, 2001

Filed:

Aug. 13, 1998
Applicant:
Inventor:

Mika Tiilikainen, Helsinki, FI;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05F 1/10 ;
U.S. Cl.
CPC ...
G05F 1/10 ;
Abstract

A method of calibrating a field effect transistor having a source (,), a drain (,), a resistive gate (,), and a calibration DC current source (,) and a calibration DC current sink (,) coupled to respective spaced apart regions of the transistor gate (,). In use a substantially DC calibration current is passed through the gate (,) between said spaced apart regions to trim the effective width of the transistor channel.


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