The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 30, 2001

Filed:

Aug. 28, 1998
Applicant:
Inventor:

Masanori Itoh, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 3/102 ;
U.S. Cl.
CPC ...
G01R 3/102 ;
Abstract

A device evaluation circuit capable of easily matching the impedance of a mounted IC to be measured to that of a measurement system. In the device evaluation circuit, a ceramic head used to improve durability of the device evaluation circuit comprises a base and, for example, ceramic plates. Micro strip lines electrically connected to corresponding micro strip lines of a substrate are respectively formed on the ceramic plates. Further, ground patterns are respectively formed on the ceramic plates. Matching devices are implemented between the micro strip line and the ground patterns and between the micro strip line and the ground patterns respectively so that impedance matching is easily done in the neighborhood of an IC to be measured.


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