The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 30, 2001

Filed:

Jul. 24, 1998
Applicant:
Inventors:

Kelly Bruland, Seattle, WA (US);

William M. Dougherty, Bothell, WA (US);

Joseph L. Garbini, Seattle, WA (US);

John Sidles, Seattle, WA (US);

Assignee:

University of Washington, Seattle, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/00 ;
U.S. Cl.
CPC ...
G01V 3/00 ;
Abstract

The present invention provides a magnetic resonance force microscopy apparatus and method for use in combination with an oscillator. The oscillator has a motional body and one member of a sample/magnet pair is disposed on the motional body. The present invention actuates the motional body. The apparatus comprises a holder adapted to mount the second member of a sample/magnet pair, an RF field generator positioned to apply a field to the sample, a motion sensor adapted to be coupled with the motional body, an actuator adapted to be coupled with the motional body, and a motion controller coupled with the actuator and with the motion sensor. The actuation effort can dampen the vibrational amplitude of the oscillator that would otherwise diminish the spatial resolution of the device; control the oscillator dynamical properties to allow more stable signal detection; vary the distance between the magnetic tip and the sample material for sample scanning and field modulation; apply actuation and control signals to help prevent the oscillator from contacting and sticking to the sample material or other device components; provide a method for calibrating instrument subsystems; provide a way for controlling all oscillator vibrational modes, including torsional modes; and provide a way to apply feedback control to the oscillator, thereby gaining dynamic advantages.


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