The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2001
Filed:
Jan. 25, 1999
Martin Gutekunst, Eberfing, DE;
Hans-Joachim Höltke, Penzberg, DE;
Boehringer Mannheim GmbH, Mannheim, DE;
Abstract
Image recording system for the evaluation of analytical test elements with a holding unit (,) into which the test elements are placed or onto which they are placed as well as a lens system (,) which records an image of the test elements on a CCD chip (,) and an evaluation unit that evaluates the image on the CCD chip or displays it on a monitor. The image recording system enables numerous test elements of different sizes to be evaluated at different wavelengths without requiring focussing by the user. The lens system used for this is a reducing optical system with an aperture on the side of the image of at least 0.7 and a distance between the CCD chip and the nearest lens of the lens system of less than 15 mm. In addition the distance between the nearest lens of the lens system and the CCD chip is kept constant to at least 10 &mgr;m in order to ensure an adequate sharpness. A compensator is described for keeping this distance constant.