The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2001
Filed:
Dec. 04, 1998
Myles Markey, Jr., Ann Arbor, MI (US);
Dale R. Greer, Novi, MI (US);
Stephen James Tenniswood, Rochester, MI (US);
Jesper Christensen, Freising, DE;
Perceptron, Inc., Plymouth, MI (US);
Abstract
A temperature compensation system (,) is provided for compensating measurements from a sensor (,). A temperature transducer (,) is placed in close proximity to a manufacturing workstation as a means of measuring the ambient temperature associated with the workstation (,). A reference workpiece (,) is placed within a sensing zone of the sensor (,). The system (,) includes a temperature compensating module (,) that is connected to the sensor (,) and to the temperature transducer (,) for determining a baseline measurement of the reference workpiece at a reference temperature. The temperature compensating module (,) is further adapted for collecting a plurality of measurements of the reference workpiece over a plurality of temperatures for establishing a relationship between these measurements and their corresponding temperature values. In addition, a workpiece measuring module (,) is also connected to the sensor (,) and to the temperature transducer (,) for measuring a first workpiece at a first temperature, whereby the sensor measurement is compensated for temperature using this relationship. In this way, the temperature compensation system (,) compensates the sensor measurement for physical changes in any of the components of the workstation that are caused by fluctuations in ambient temperature. Rather than compensate for ambient temperature changes, the temperature compensation system (,) may also be adapted to compensate sensor measurements based on process driven temperature changes (i.e., a “hot” workpiece).