The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2001
Filed:
Nov. 19, 1997
Applicant:
Inventor:
Christopher J. Manning, Moscow, ID (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/32 ;
U.S. Cl.
CPC ...
G01N 3/32 ;
Abstract
Three or more frequency components are used as deformation waveforms to perturb a sample during spectroscopic measurement. Simultaneously measuring more than one frequency allows for multiplexing. Further, many frequencies insure that the optimal perturbation frequencies for a particular measurement are present. The multiplex advantage of a particular spectroscopic instrument may accrue simultaneously with a multiplex advantage in the characterization of the time dependence of the sample response.
Manning, Christopher. (2001). Method and device for multiplexed spectro-rheological measurements (U.S. Patent No. 6178822). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6178822
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile