The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2001
Filed:
Nov. 19, 1997
Scott M. Hewelt, China, MI (US);
Michael C. Torzewski, Jeddo, MI (US);
Norman F. Marsh, Port Huron, MI (US);
Venture Measurement Company LLC, Spartanburg, SC (US);
Abstract
A system for point-level detection of material within a vessel includes a transmission line probe adapted to be mounted to a wall of the vessel so as to extend within the vessel for contact with material when the material reaches a preselected level within the vessel. Electronics are operatively coupled to one end of the probe for launching microwave energy along the probe. The electronics are responsive to a change in microwave energy reflected from the free end of the probe within the vessel when the material is in contact with the probe, employing time-domain reflectometry techniques, for indicating that the material is in contact with the probe. This change in reflected microwave energy may comprise a change in phase or, more preferably, a change in apparent length of the probe resulting from contact with material having a higher dielectric constant than that of air when air surrounds the probe. The electronics preferably are also responsive to a decrease in apparent length of the probe for indicating a failure condition at the transmission line probe or electronics.