The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 23, 2001
Filed:
Sep. 17, 1998
Applicant:
Inventors:
Evanthia Papadopoulou, White Plains, NY (US);
Der-Tsai Lee, Wilmette, IL (US);
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/750 ;
U.S. Cl.
CPC ...
G06F 1/750 ;
Abstract
A method for computing critical area for shorts of a layout, in accordance with the present invention, includes the steps of computing a Voronoi diagram for the layout, computing a second order Voronoi diagram to arrive at a partitioning of the layout into regions, computing critical area within each region and summing the critical areas to arrive at a total critical area for shorts in the layout. A system is also provided for calculating the critical area.