The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 23, 2001
Filed:
Feb. 11, 1998
Applicant:
Inventor:
Kiyoshi Fukahori, Tokyo, JP;
Assignee:
Texas Instruments, Incoporated, Dalllas, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/341 ;
U.S. Cl.
CPC ...
H03M 1/341 ;
Abstract
A metric calculator is disclosed having an interleaved structure for increasing the time during which metrics can be calculated by circuit components. A first interleave samples voltage of the received signal during a first phase and a second interleave samples voltage of the received signal during an opposite phase. The interleaved architecture calculates and updates metrics and decisions based on these metrics at code rate, without requiring completion of all ACS computations in one code period.