The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 23, 2001
Filed:
May. 11, 1998
Leland Leslie Day, Rochester, MN (US);
Paul Allen Ganfield, Rochester, MN (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A system and method for conducting a repeatable logic test on at least one functional unit of an IC chip includes steps of selecting at least one functional unit of at least several functional units, propagating test data through a part or all functional units of the time domain; and capturing test data of the selected functional unit. The functional units are either selected or held inactive such that only the selected functional unit is allowed to capture the test results for determining a critical timing path within the selected functional unit and only the functional unit. By selecting different combination of the functional unit(s), a number of the critical timing paths are readily determined in the chip.