The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 23, 2001
Filed:
Jun. 23, 1998
Mario Roederer, Redwood City, CA (US);
Adam S. Treister, San Carlos, CA (US);
Martin Bigos, San Francisco, CA (US);
David R. Parks, San Francisco, CA (US);
Wayne A. Moore, San Francisco, CA (US);
Leonore A. Herzenberg, Stanford, CA (US);
The Board of Trustees of the Leland Stanford Junior University, Stanford, CA (US);
Abstract
This invention relates a series of methods for the visual representation and subsequent application of analyses on complex data sets. In particular, this invention is useful for the analysis of multiple sample sets that share common features, for which similar types of analyses are desired. Three concepts are embodied to aid in this analysis: “Functional equivalence by Algorithmic Polymorphism” (FEAP), in which an analysis algorithm is abstracted through the use of an associated name; a genealogical metaphor for the representation of successive or parallel analysis steps, in which “families” of analyses can be easily copied between different sample data sets; and batch analysis through the creation of multi-sample analysis surrogates (MSAS), which are groups of samples wherein analyses applied to an MSAS is then applied to every sample within the MSAS group. This invention has particular utility in the analysis of data derived from flow cytometers, the analysis of complex demographic data, and other similar data sets.